@prefix rdf: . @prefix dct: . @prefix owl: . @prefix xml: . @prefix xsd: . @prefix af-c: . @prefix af-e: . @prefix af-m: . @prefix af-p: . @prefix af-q: . @prefix af-r: . @prefix af-x: . @prefix rdfs: . @prefix skos: . @prefix af-cur: . af-e:AFE_0000210 a owl:Class ; rdfs:subClassOf af-e:AFE_0000454 ; skos:definition "An X-ray source where copper atoms emit X-rays through a 1s from 2p transition. [CHMO]" ; skos:prefLabel "copper K-alpha source" . af-e:AFE_0000242 a owl:Class ; rdfs:subClassOf af-e:AFE_0000454 ; skos:definition "An X-ray source where aluminium atoms emit X-rays through a 1s from 2p transition. [CHMO]" ; skos:prefLabel "aluminium K-alpha source" . af-e:AFE_0000441 a owl:Class ; rdfs:subClassOf af-e:AFE_0000454 ; skos:definition "An X-ray source where cobalt atoms emit X-rays through a 1s from 2p transition. [CHMO]" ; skos:prefLabel "cobalt K-alpha source" . af-e:AFE_0000454 a owl:Class ; rdfs:subClassOf af-e:AFE_0001876 . af-e:AFE_0000682 a owl:Class ; rdfs:subClassOf af-e:AFE_0000454 ; skos:definition "An X-ray source where molybdenum atoms emit X-rays through a 1s from 2p transition. [CHMO]" ; skos:prefLabel "molybdenum K-alpha source" . af-e:AFE_0001664 a owl:Class ; rdfs:subClassOf af-e:AFE_0000354 ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "An X-ray tube is a vacuum tube that contains the X-ray source. [Allotrope]" ; skos:prefLabel "X-ray tube" . af-e:AFE_0001673 a owl:Class ; rdfs:subClassOf af-e:AFE_0000986, af-e:AFE_0001876 ; skos:changeNote "2015-11-25 add concept [Amgen]", "2016-03-18 move under X-ray device, change definition [OSTHUS]" ; skos:definition "A soller slit consists of a large numbers of planes in the plane of diffraction and limits the spread of the incident and diffracted X-ray beam out of the plane of diffraction. [Allotrope]" ; skos:prefLabel "soller slit" . af-e:AFE_0001674 a owl:Class ; rdfs:subClassOf af-e:AFE_0000986, af-e:AFE_0001876 ; skos:altLabel "scatter slit" ; skos:changeNote "2015-11-25 add concept [Amgen]", "2015-12-15 Fixed typo in prefLabel [OSTHUS]", "2016-03-18 move under X-ray device, change definition [OSTHUS]" ; skos:definition "An anti scatter slit is a slit that is used for controlling the width of incident X-rays. It determines the observed length on the sample. [Allotrope]" ; skos:prefLabel "anti-scatter slit" . af-e:AFE_0001675 a owl:Class ; rdfs:subClassOf af-e:AFE_0000986, af-e:AFE_0001876 ; skos:changeNote "2015-11-25 add concept [Amgen]", "2016-03-18 move under X-ray device, change definition [OSTHUS]" ; skos:definition "A receiving slit is a slit that is used for controlling the width of the X-ray beam entering the X-ray detector. [Allotrope]" ; skos:prefLabel "receiving slit" . af-e:AFE_0001676 a owl:Class ; rdfs:subClassOf af-e:AFE_0000354 ; skos:altLabel "mask" ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "A mask is a device that defines the slit of a detector. It allows for shaping the beam. [Allotrope]" ; skos:editorialNote "2017-10-26 needs revisiting [OSTHUS]" ; skos:example "a mask defines the area of radiation", "mask of soller slit in XRD" ; skos:prefLabel "mask (XRD)" . af-e:AFE_0001738 a owl:Class ; rdfs:subClassOf af-e:AFE_0000986, af-e:AFE_0001876 ; skos:changeNote "2015-11-25 add concept [Amgen]", "2016-03-18 move under X-ray device, change definition [OSTHUS]" ; skos:definition "A divergence slit is a slit that is used to limit the divergence of the incident X-rays. The slit blocks X-rays that have to great a divergence. It determines the irradiated length of the sample. [Allotrope]" ; skos:prefLabel "divergence slit" . af-e:AFE_0001783 a owl:Class ; rdfs:subClassOf af-e:AFE_0000354 ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "The goniometer is the part of a diffractometer that allows for measurement of the 2Theta angle. [Allotrope]" ; skos:prefLabel "goniometer" . af-p:AFP_0000005 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "TR-XRD", "TRXRD", "time resolved X-ray diffraction" ; skos:definition "A method for determining structure by directing a short (ns or ps) pulse beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate as a function of time. [CHMO]" ; skos:prefLabel "time-resolved X-ray diffraction" . af-p:AFP_0000061 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "single crystal X-ray crystallography", "single-crystal X-ray diffraction" ; skos:definition "A method for determining structure by directing a beam of X-rays at a single crystal sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. Single crystal X-ray diffraction is used for protein crystallography. [CHMO]" ; skos:prefLabel "single crystal X-ray diffraction" . af-p:AFP_0000069 a owl:Class ; rdfs:subClassOf af-p:AFP_0002372 ; skos:altLabel "MIRAS" ; skos:definition "A method for providing phasing necessary for X-ray crystallography information by growing a number of crystals of the sample substituted with different heavy metal atoms and analysing the X-ray data for each crystal. When the absorption edge of an atom in the crystals is close to the wavelength of the incident radiation the atom becomes an anomalous scatterer. Anomalous scattering can be used for phase determination and also for determining the absolute configuration. [CHMO]" ; skos:prefLabel "multiple isomorphous replacement with anomalous scattering" . af-p:AFP_0000101 a owl:Class ; rdfs:subClassOf af-p:AFP_0000884 ; skos:altLabel "Kossel technique", "Kossel-technique", "MXRD", "micro X-ray diffraction", "micro XRD", "micro in situ XRD" ; skos:definition "A method for determining structure by detecting the positions and intensities of X-rays, that have been generated in microstructural domain, as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "in situ micro-X-ray diffraction" . af-p:AFP_0000282 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "VT-XRD", "X-ray thermodiffractometry", "temperature-resolved XRD", "variable-temperature X-ray diffraction" ; skos:definition "A method for determining structure by directing a beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate as a function of temperature. [CHMO]" ; skos:prefLabel "temperature-resolved X-ray diffraction" . af-p:AFP_0000421 a owl:Class ; rdfs:subClassOf af-p:AFP_0001200 ; skos:altLabel "GISAXS", "GIXS", "grazing incidence X-ray scattering", "grazing incidence small-angle X-ray scattering", "grazing-incidence small-angle X-ray scattering" . af-p:AFP_0000481 a owl:Class ; rdfs:subClassOf af-p:AFP_0001200 ; skos:altLabel "2-D SAXS", "2-dimensional SAXS", "2-dimensional small-angle X-ray scattering", "2D SAXS", "2D-SAXS", "SAXS with 2D detection", "two-dimensional SAXS" . af-p:AFP_0000561 a owl:Class ; rdfs:subClassOf af-p:AFP_0000645 ; skos:altLabel "SR-PXD", "SR-XRPD" ; skos:definition "A method for determining structure by directing a beam of X-rays at a powder sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. The X-rays are generated by the acceleration of charged particles through magnetic fields. [CHMO]" ; skos:prefLabel "synchrotron X-ray powder diffraction" . af-p:AFP_0000580 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "WAXRD" ; skos:definition "A method for determining structure by directing a beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. The incident X-ray beam strikes the sample at a wide angle (>10 deg.). [CHMO]" ; skos:prefLabel "wide-angle X-ray diffraction" . af-p:AFP_0000645 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "PXD", "PXRD", "X-ray powder diffraction", "XRPD", "powder XRD" ; skos:definition "A method for determining structure by directing a beam of X-rays at a powdered solid sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "powder X-ray diffraction" . af-p:AFP_0000655 a owl:Class ; rdfs:subClassOf af-p:AFP_0001791 ; skos:altLabel "GAXRD", "GID", "GIXRD", "glancing angle X-ray diffraction", "glancing angle XRD", "glancing incidence X-ray diffraction", "glancing incidence XRD", "glancing-angle X-ray diffraction", "glancing-angle XRD", "glancing-incidence X-ray diffraction", "glancing-incidence XRD", "grazing angle X-ray diffraction", "grazing angle XRD", "grazing incidence X-ray diffraction", "grazing incidence XRD", "grazing-angle XRD", "grazing-angle incidence X-ray diffraction", "grazing-angle incidence XRD", "grazing-incidence X-ray diffraction", "grazing-incidence XRD", "grazing-incidence diffraction" ; skos:definition "A method for determining structure by directing a beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. The incident X-ray beam strikes the sample at a small angle (<5 deg.) close to the critical angle of total external X-ray reflection. [CHMO]" ; skos:prefLabel "grazing-angle X-ray diffraction" . af-p:AFP_0000668 a owl:Class ; rdfs:subClassOf af-p:AFP_0000111 ; skos:altLabel "WAXS", "wide angle X-ray scattering" . af-p:AFP_0000884 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:definition "A method for determining structure by detecting the positions and intensities of X-rays, that have been generated within a structural domain, as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "in situ X-ray diffraction" . af-p:AFP_0000893 a owl:Class ; rdfs:subClassOf af-p:AFP_0000668 ; skos:altLabel "AWAXS", "anomalous wide angle X-ray scattering" . af-p:AFP_0000944 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "HR-XRD", "HRXRD", "high resolution X-ray diffraction", "high resolution XRD", "high-resolution XRD" ; skos:definition "A method for determining structure by directing a parallel beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "high-resolution X-ray diffraction" . af-p:AFP_0000958 a owl:Class ; rdfs:subClassOf af-p:AFP_0001088 ; skos:altLabel "SIR" ; skos:definition "A method for providing phasing necessary for X-ray crystallography information by growing a crystal of the sample substituted with heavy metal atoms and analysing the X-ray data for both the original crystal and the isomorph. [CHMO]" ; skos:prefLabel "single isomorphous replacement" . af-p:AFP_0001088 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:definition "A method for providing phasing necessary for X-ray crystallography information by introducing heavy atoms into isomorphous crystals. [CHMO]" ; skos:prefLabel "isomorphous replacement" . af-p:AFP_0001133 a owl:Class ; rdfs:subClassOf af-p:AFP_0000111 ; skos:altLabel "synchrotron XRS" . af-p:AFP_0001139 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:definition "A method for determining structure by scanning a finely focused (<10 µm2) beam of X-rays over the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "scanning probe X-ray diffraction" . af-p:AFP_0001200 a owl:Class ; rdfs:subClassOf af-p:AFP_0000111 ; skos:altLabel "SAXS", "small angle X-ray scattering" . af-p:AFP_0001717 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "SR-XRD", "synchrotron X-ray diffraction", "synchrotron XRD" ; skos:definition "A method for determining structure by directing a beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. The X-rays are generated by the acceleration of charged particles through magnetic fields. [CHMO]" ; skos:prefLabel "synchrotron radiation X-ray diffraction" . af-p:AFP_0001784 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "SXD", "SXRD", "solution state X-ray diffraction", "solution-state X-ray diffraction" ; skos:definition "A method for determining structure by directing a beam of X-rays at a sample solution and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "solution X-ray diffraction" . af-p:AFP_0001788 a owl:Class ; rdfs:subClassOf af-p:AFP_0001200 ; skos:altLabel "synchrotron SAXS", "synchrotron small angle X-ray scattering (SAXS)" . af-p:AFP_0001791 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "SAXD", "SAXRD", "X-ray SAD", "X-ray small angle diffraction", "small angle X-ray diffraction", "small angle XRD", "small-angle XRD" ; skos:definition "A method for determining structure by directing a beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. The incident X-ray beam strikes the sample at a small angle (0-10 deg.). [CHMO]" ; skos:prefLabel "small-angle X-ray diffraction" . af-p:AFP_0001877 a owl:Class ; rdfs:subClassOf af-p:AFP_0000580, af-p:AFP_0000645 ; skos:altLabel "WAPXRD", "wide-angle X-ray powder diffraction" ; skos:definition "A method for determining structure by directing a beam of X-rays at the powdered sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. The incident X-ray beam strikes the sample at a wide angle (>10 deg.). [CHMO]" ; skos:prefLabel "wide-angle powder X-ray diffraction" . af-p:AFP_0001907 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "thin film X-ray diffraction", "thin film XRD", "thin-film XRD" ; skos:definition "A range of techniques used to determine the structure of thin films by directing a beam of X-rays at the sample and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. Techniques include glancing-incidence X-ray reflectivity and pole figure measurements. [CHMO]" ; skos:prefLabel "thin-film X-ray diffraction" . af-p:AFP_0001928 a owl:Class ; rdfs:subClassOf af-p:AFP_0000958 ; skos:altLabel "SIRAS" ; skos:definition "A method for providing phasing necessary for X-ray crystallography information by growing a crystal of the sample substituted with heavy metal atoms and analysing the X-ray data for both the original crystal and the isomorph. When the absorption edge of an atom in the crystals is close to the wavelength of the incident radiation the atom becomes an anomalous scatterer. Anomalous scattering can be used for phase determination and also for determining the absolute configuration. [CHMO]" ; skos:prefLabel "single isomorphous replacement with anomalous scattering" . af-p:AFP_0002151 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "HT-XRD", "HTXRD", "high temperature X-ray diffraction", "high temperature XRD", "high-temperature XRD" ; skos:definition "A method for determining structure by directing a beam of X-rays at the sample which is heated from 25-2000 deg. C and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "high-temperature X-ray diffraction" . af-p:AFP_0002233 a owl:Class ; rdfs:subClassOf af-p:AFP_0000884 ; skos:altLabel "in situ synchrotron XRD" ; skos:definition "A method for determining structure by detecting the positions and intensities of X-rays, that have been generated within a synchrotron, as a pattern of spots on a photographic plate. [CHMO]" ; skos:prefLabel "in situ synchrotron X-ray diffraction" . af-p:AFP_0002372 a owl:Class ; rdfs:subClassOf af-p:AFP_0001088 ; skos:altLabel "MIR", "multiple isomorphous replacement (MIR) phasing" ; skos:definition "A method for providing phasing necessary for X-ray crystallography information by growing a number of crystals of the sample substituted with different heavy metal atoms and analysing the X-ray data for each crystal. [CHMO]" ; skos:prefLabel "multiple isomorphous replacement" . af-p:AFP_0002699 a owl:Class ; rdfs:subClassOf af-r:AFR_0000922 ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "The beam path is a data object that describes the pathway of the X-ray beam from the X-ray tube to the sample and to the detector. [Allotrope]" ; skos:prefLabel "beam path" . af-p:AFP_0002719 a af-p:AFP_0002720, owl:NamedIndividual ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "Code of continuous scanning in XRPD. [Allotrope]" ; skos:prefLabel "continuous" . af-p:AFP_0002720 a owl:Class ; rdfs:subClassOf af-c:AFC_0000050 ; skos:altLabel "XRPD mode code" ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "The differential scanning calorimetry scan mode code encodes the mode of measurement of DSC. [Allotrope]" ; skos:prefLabel "x-ray powder diffraction scan mode code" . af-p:AFP_0002757 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "VT-XRPD" ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "Variable temperature X-ray powder diffraction is an XRPD measurement with change of temperature. [Allotrope]" ; skos:prefLabel "variable temperature X-ray powder diffraction" . af-p:AFP_0002772 a owl:Class ; rdfs:subClassOf af-p:AFP_0000487 ; skos:altLabel "VH-XRPD" ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "Variable humidity x-ray powder diffraction is an XRPD measurement with change of humidity. [Allotrope]" ; skos:prefLabel "variable humidity x-ray powder diffraction" . af-x:AFX_0000412 a owl:ObjectProperty ; rdfs:range af-p:AFP_0002699 ; skos:changeNote "2015-11-25 add concept [Amgen]" ; skos:definition "The beam path that is related to the entity. [Allotrope]" ; skos:prefLabel "has beam path" . af-x:AFX_0002796 a owl:AnnotationProperty . af-x:AFX_0002798 a owl:AnnotationProperty . af-x:AFX_0002809 a owl:AnnotationProperty . af-r:AFR_0000045 a owl:Class ; rdfs:subClassOf af-r:AFR_0000428 ; skos:altLabel "SAXS data", "SAXS image", "SAXS pattern", "small angle X-ray scattering data", "small angle X-ray scattering pattern", "small-angle X-ray scattering pattern" ; skos:definition "Data which is obtained from an X-ray scattering experiment where the X-rays are scattered by the sample at low angles (0--10 deg.). [CHMO]" ; skos:prefLabel "small-angle X-ray scattering data" . af-r:AFR_0000059 a owl:Class ; rdfs:subClassOf af-r:AFR_0000406 ; skos:altLabel "X-ray crystallographic data", "X-ray diffraction (XRD) patterns", "X-ray diffraction (XRD) spectra", "X-ray diffraction spectra", "X-ray pattern", "XRD data", "XRD diffractogram", "XRD pattern", "XRD patterns", "XRD profile", "XRD spectra", "x-ray diffraction pattern" ; skos:definition "Data which is obtained from an X-ray diffraction experiment. [CHMO]" ; skos:prefLabel "X-ray diffraction data" . af-r:AFR_0000169 a owl:Class ; rdfs:subClassOf af-r:AFR_0000190 ; skos:altLabel "low-angle powder X-ray diffraction data", "low-angle powder X-ray diffraction pattern", "small-angle powder X-ray diffraction pattern" ; skos:definition "Data which is obtained from an X-ray diffraction experiment where the specimen is a powder and the X-rays are incident on the sample at small angles (0--10 degrees). [CHMO]" ; skos:prefLabel "small-angle powder X-ray diffraction data" . af-r:AFR_0000190 a owl:Class ; rdfs:subClassOf af-r:AFR_0000059 ; skos:altLabel "PXD data", "PXD pattern", "PXRD data", "PXRD pattern", "XRD powder pattern", "powder X-ray diffraction (PXRD) patterns", "powder X-ray diffraction (XRD) pattern", "powder X-ray diffraction (XRD) patterns", "powder X-ray diffractogram", "powder X-ray diffractograms", "powder XRD data", "powder XRD pattern" ; skos:definition "Data which is obtained from an X-ray diffraction experiment where the specimen is a powder. [CHMO]" ; skos:prefLabel "powder X-ray diffraction data" . af-r:AFR_0000269 a owl:Class ; rdfs:subClassOf af-r:AFR_0000045 ; skos:altLabel "2D SAXS pattern", "2D-SAXS image", "2D-SAXS pattern", "two-dimensional (2D) SAXS pattern", "two-dimensional (2D) SAXS patterns" ; skos:definition "Data which is obtained from an X-ray scattering experiment where two separate beams of X-rays scattered by a sample at low angles (0--10 deg). [CHMO]" ; skos:prefLabel "two-dimensional small-angle X-ray scattering data" . af-r:AFR_0000365 a owl:Class ; rdfs:subClassOf af-r:AFR_0000059 ; skos:altLabel "single crystal X-ray diffraction data" ; skos:definition "Data which is obtained from an X-ray diffraction experiment where the specimen is a single crystal. [CHMO]" ; skos:prefLabel "single-crystal X-ray diffraction data" . af-r:AFR_0000455 a owl:Class ; rdfs:subClassOf af-r:AFR_0000059 ; skos:altLabel "low-angle XRD patterns", "small-angle XRD data", "small-angle XRD pattern", "small-angle XRD spectrum" ; skos:definition "Data which is obtained from an X-ray diffraction experiment where the X-rays are incident on the sample at small angles (0--10 degrees). [CHMO]" ; skos:prefLabel "small-angle X-ray diffraction data" . af-r:AFR_0000640 a owl:Class ; rdfs:subClassOf af-r:AFR_0000432 ; skos:changeNote "2015-11-25 add concept [Amgen]", "2016-03-29 move under peak list [OSTHUS]" ; skos:definition "A collection of diffraction peaks as a function of 2Theta. [Allotrope]" ; skos:prefLabel "diffraction pattern" . dct:issued "2017-11-24T04:10:00Z"^^xsd:dateTime ; dct:license ; dct:modified "2018-04-12T12:00:00Z"^^xsd:dateTime ; dct:rights , ; dct:rightsHolder ; dct:title "AFO X-ray Diffraction Domain Ontology - working draft" ; a owl:NamedIndividual, owl:Ontology ; owl:imports ; owl:priorVersion ; owl:versionIRI ; owl:versionInfo "WD/2018/04" . dct:description """ These taxonomies contain material or may constitute derivative works of material which may be subject to copyright by one of the following organizations. 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Copyright © 2015-2018 Allotrope Foundation """ ; dct:title "Creative Commons Attribution 4.0 International Public License" ; a dct:LicenseDocument, owl:NamedIndividual . dct:source a owl:AnnotationProperty . skos:altLabel a owl:AnnotationProperty . skos:changeNote a owl:AnnotationProperty . skos:definition a owl:AnnotationProperty . skos:example a owl:AnnotationProperty . skos:note a owl:AnnotationProperty . skos:prefLabel a owl:AnnotationProperty . skos:scopeNote a owl:AnnotationProperty .